Invention Grant
- Patent Title: Profile inspection system for threaded and axial components
- Patent Title (中): 螺纹和轴向部件轮廓检查系统
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Application No.: US11510402Application Date: 2006-08-25
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Publication No.: US07684054B2Publication Date: 2010-03-23
- Inventor: David Crowther
- Applicant: David Crowther
- Applicant Address: US MI Davisburg
- Assignee: GII Acquisition, LLC
- Current Assignee: GII Acquisition, LLC
- Current Assignee Address: US MI Davisburg
- Agency: Brooks Kushman P.C.
- Main IPC: G06T7/60
- IPC: G06T7/60

Abstract:
A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In the preferred embodiment, the detector has a field of view wider than the width of the component, thereby enabling the detector to image a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component and a processor, in communication with the detector and the translation stage, is operative to: a) receive electrical signals representative of the outer profile imaged by the detector; b) move the translation stage incrementally along the length of the component; and c) record the outer profile imaged by the detector at each increment and form a composite profile of the component. In the preferred embodiment, the processor is further operative to record the composite profile of the component at one or more angular orientations by rotating the component through a predetermined angle about its axis.
Public/Granted literature
- US20080049235A1 Profile inspection system for threaded and axial components Public/Granted day:2008-02-28
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