Invention Grant
- Patent Title: Linear measurement apparatus
- Patent Title (中): 线性测量装置
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Application No.: US11802065Application Date: 2007-05-18
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Publication No.: US07684057B2Publication Date: 2010-03-23
- Inventor: Yoshio Sakai
- Applicant: Yoshio Sakai
- Applicant Address: JP Tokyo
- Assignee: Tanita Corporation
- Current Assignee: Tanita Corporation
- Current Assignee Address: JP Tokyo
- Agency: Hogan & Hartson LLP
- Priority: JP2006-164416 20060614; JP2007-109893 20070418
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
A linear measurement apparatus includes a measuring unit including at least one first noncontact distance measuring sensor and one second noncontact distance measuring sensor supported at a frame and aligned on opposite sides of a measured object. The measuring unit measures a plurality of first gap distances to a plurality of first object positions in a plurality of parallel first measurement lines and a plurality of second gap distances to a plurality of second object positions in a plurality of parallel second measurement lines. A distance calculator calculates a plurality of candidate object lengths on the basis of the first and second gap distances, each candidate object length being a distance between one of the first object positions and one of the second object positions. A maximum selector selects a maximum object length from among the plurality of candidate object lengths.
Public/Granted literature
- US20070291283A1 Linear measurement apparatus Public/Granted day:2007-12-20
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