Invention Grant
- Patent Title: Method and system for perpendicular magnetic media metrology
- Patent Title (中): 垂直磁性介质测量方法与系统
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Application No.: US11692762Application Date: 2007-03-28
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Publication No.: US07684145B2Publication Date: 2010-03-23
- Inventor: William Van Drent , Ferenc Vajda
- Applicant: William Van Drent , Ferenc Vajda
- Applicant Address: US MA Lowell
- Assignee: MicroSense, LLC
- Current Assignee: MicroSense, LLC
- Current Assignee Address: US MA Lowell
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G11B5/00
- IPC: G11B5/00 ; G11B5/127
Abstract:
A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.
Public/Granted literature
- US20070262771A1 Method and System for Perpendicular Magnetic Media Metrology Public/Granted day:2007-11-15
Information query
