Invention Grant
US07684254B2 Flash memory device and method of erasing memory cell block in the same
有权
闪存器件和擦除存储单元块的方法相同
- Patent Title: Flash memory device and method of erasing memory cell block in the same
- Patent Title (中): 闪存器件和擦除存储单元块的方法相同
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Application No.: US11617670Application Date: 2006-12-28
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Publication No.: US07684254B2Publication Date: 2010-03-23
- Inventor: Min Joong Jung , Byoung Kwan Jeong , Tai Kyu Kang
- Applicant: Min Joong Jung , Byoung Kwan Jeong , Tai Kyu Kang
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Townsend and Townsend and Crew LLP
- Priority: KR10-2006-0096184 20060929
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A flash memory device comprises a memory cell array having a plurality of blocks. An address register section is configured to receive a start block address of the first block to be erased among a plurality of blocks to be erased and a last block address of the last block to be erased among the plurality of blocks to be erased. A controlling logic circuit is configured to output an erase command signal and an erase block address corresponding to one of the blocks to be erased. A block address comparing section is configured to compare the erase block address output by the controlling logic circuit with the last block address, and output an erase progress signal based on the comparison of the erase block address and the last block address to the controlling logic circuit. The controlling logic circuit outputs an erase block address of to another block to be erased until the erase progress signal indicates that the last block to be erased has been or is being erased.
Public/Granted literature
- US20080084766A1 FLASH MEMORY DEVICE AND METHOD OF ERASING MEMORY CELL BLOCK IN THE SAME Public/Granted day:2008-04-10
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