Invention Grant
- Patent Title: Method of adjusting image quality of an X-ray image
- Patent Title (中): 调整X射线图像的图像质量的方法
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Application No.: US10952628Application Date: 2004-09-29
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Publication No.: US07684605B2Publication Date: 2010-03-23
- Inventor: Klaus Klingenbeck-Regn
- Applicant: Klaus Klingenbeck-Regn
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: DE10345509 20030930
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
An intuitively manageable method for adjusting at least one parameter (X) that determines the image quality of an X-ray image produced by an X-ray device (1) is provided, wherein, on a user interface (18) of the X-ray device (1) a setting zone (25) for the parameter (X) is shown pictorially, and in relation to the setting zone (25) the current setting (Xact) of the parameter (X) is likewise shown pictorially. At least two sub-zones (32, 33, 34) of the setting zone (25) are differentiated from each other by color, wherein a first sub-zone (32) corresponds to a parameter-setting that guarantees good image quality and a second sub-zone (34) corresponds to a parameter-setting that is critical for the image quality.
Public/Granted literature
- US20050069083A1 Method of adjusting image quality of an X-ray image Public/Granted day:2005-03-31
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