Invention Grant
- Patent Title: Optical signal quality monitoring circuit and optical signal quality monitoring method
- Patent Title (中): 光信号质量监控电路和光信号质量监控方法
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Application No.: US10585532Application Date: 2005-06-03
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Publication No.: US07684697B2Publication Date: 2010-03-23
- Inventor: Ippei Shake , Hidehiko Takara , Atsushi Taniguchi
- Applicant: Ippei Shake , Hidehiko Takara , Atsushi Taniguchi
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Workman Nydegger
- Priority: JP2004-166453 20040603
- International Application: PCT/JP2005/010224 WO 20050603
- International Announcement: WO2005/119943 WO 20051215
- Main IPC: H04B10/08
- IPC: H04B10/08

Abstract:
The present invention provides an optical signal quality monitoring circuit and an optical signal quality monitoring method for measuring correct optical signal quality parameters when a signal bit rate is changed. The optical signal quality monitoring circuit which samples and converts an electrical signal converted from an optical signal with a given repeated frequency f1 to digital sampling data through an analog to digital conversion, thereafter, evaluates an optical signal quality parameter of the optical signal by subjecting sampling data to electrical signal processing in an integrated circuit in which a signal processing function is programmed, receives a control signal notifying that the bit rate of the optical signal is changed, or detects that the bit rate of the optical signal is changed to correct optical the signal quality parameter of the optical signal corresponding to the signal bit rate of the optical signal which is changed.
Public/Granted literature
- US20080285970A1 Optical Signal Quality Monitoring Circuit and Optical Signal Quality Monitoring Method Public/Granted day:2008-11-20
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