Invention Grant
US07684943B2 Probe carrier management method, probe carrier manufacturing apparatus and probe carrier managing apparatus
失效
探头载体管理方法,探针载体制造装置和探针载体管理装置
- Patent Title: Probe carrier management method, probe carrier manufacturing apparatus and probe carrier managing apparatus
- Patent Title (中): 探头载体管理方法,探针载体制造装置和探针载体管理装置
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Application No.: US11687946Application Date: 2007-03-19
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Publication No.: US07684943B2Publication Date: 2010-03-23
- Inventor: Nobuyuki Okamura , Makoto Kameyama , Tadashi Okamoto
- Applicant: Nobuyuki Okamura , Makoto Kameyama , Tadashi Okamoto
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2001-094366 20010328
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A method for appropriately managing the quality and distribution of a probe carrier. Probe carriers manufactured by a probe carrier manufacturing apparatus having ejecting portions for ejecting probe solutions, each containing a probe, which can be specifically coupled with a target substance, for applying the probe solution on a carrier, and a plurality of probe tanks storing mutually different probe solutions for supplying ejecting portions. Each probe tank is labeled with the bar-code. The labeled bar-code is read by the bar-code reader. On the basis of the read bar-code, the probe solution stored in the probe tank is identified. On the other hand, the probe tank is mounted on the ejecting portion.
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