Invention Grant
US07684949B2 Apparatus and method for determining reliability of an integrated circuit
有权
用于确定集成电路的可靠性的装置和方法
- Patent Title: Apparatus and method for determining reliability of an integrated circuit
- Patent Title (中): 用于确定集成电路的可靠性的装置和方法
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Application No.: US11843721Application Date: 2007-08-23
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Publication No.: US07684949B2Publication Date: 2010-03-23
- Inventor: Henrich Koerner
- Applicant: Henrich Koerner
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Patent Department
- Agent Philip Schlazer
- Priority: DE102006039546 20060823
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/00 ; G01R27/00 ; G06F19/00 ; G06F17/40
Abstract:
In an embodiment, an integrated circuit or chip is supplied to its intended application and a measurement quantity representing the state of one or a plurality of electrical connections in the chip is determined within the application environment of the chip and, if the measurement quantity determined does not correspond to predefined criteria, a corresponding signal is output.
Public/Granted literature
- US20080197870A1 Apparatus and Method For Determining Reliability Of An Integrated Circuit Public/Granted day:2008-08-21
Information query
