Invention Grant
- Patent Title: System and method for detecting software defects
- Patent Title (中): 用于检测软件缺陷的系统和方法
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Application No.: US11670143Application Date: 2007-02-01
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Publication No.: US07685471B2Publication Date: 2010-03-23
- Inventor: Sreeranga P. Rajan , Oksana Tkachuk , Mukul R. Prasad , Indradeep Ghosh
- Applicant: Sreeranga P. Rajan , Oksana Tkachuk , Mukul R. Prasad , Indradeep Ghosh
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Baker Botts L.L.P.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method for detecting software defects includes selecting from a target program comprising a plurality of modules a first module for evaluation and isolating the first module. The method also includes iteratively performing the following steps until the first module has been reduced such that a validation program is able to determine whether the first module contains a defect: generating an environment surrounding the first module, the generated environment preserving at least one external constraint on the first module; reducing the size of the first module; and reducing the number of program states associated with the first module.
Public/Granted literature
- US20080189686A1 System and Method for Detecting Software Defects Public/Granted day:2008-08-07
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