Invention Grant
- Patent Title: Testing of an embedded multiplexer having a plurality of inputs
- Patent Title (中): 具有多个输入的嵌入式多路复用器的测试
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Application No.: US11880158Application Date: 2007-07-19
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Publication No.: US07685486B1Publication Date: 2010-03-23
- Inventor: Andrew W. Lai
- Applicant: Andrew W. Lai
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Lois D. Cartier
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
Functional testing of an integrated circuit (IC) is a part from a more comprehensive and thorough testing. An IC including an embedded select circuit module coupled to receive numerous input signals. The IC may also include control circuit coupled to receive input control signals, where at least one input control signal of the input control signals is a mode signal. Asserting the mode signal may operate the select circuit module in a test mode.
Information query