Invention Grant
US07685486B1 Testing of an embedded multiplexer having a plurality of inputs 有权
具有多个输入的嵌入式多路复用器的测试

  • Patent Title: Testing of an embedded multiplexer having a plurality of inputs
  • Patent Title (中): 具有多个输入的嵌入式多路复用器的测试
  • Application No.: US11880158
    Application Date: 2007-07-19
  • Publication No.: US07685486B1
    Publication Date: 2010-03-23
  • Inventor: Andrew W. Lai
  • Applicant: Andrew W. Lai
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Lois D. Cartier
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Testing of an embedded multiplexer having a plurality of inputs
Abstract:
Functional testing of an integrated circuit (IC) is a part from a more comprehensive and thorough testing. An IC including an embedded select circuit module coupled to receive numerous input signals. The IC may also include control circuit coupled to receive input control signals, where at least one input control signal of the input control signals is a mode signal. Asserting the mode signal may operate the select circuit module in a test mode.
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