Invention Grant
- Patent Title: Multipoint nanoprobe method of making
- Patent Title (中): 多点纳米探针法制作
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Application No.: US11930401Application Date: 2007-10-31
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Publication No.: US07685708B2Publication Date: 2010-03-30
- Inventor: Daniel Worledge
- Applicant: Daniel Worledge
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01R43/16
- IPC: H01R43/16
Abstract:
A nanoprobe includes a substrate having a layer, which forms a projected portion. A plurality of conductive lines is adhered to the projected portion and the lines extend beyond an end of the projected portion by a distance to form contact points, wherein the lines are connected to material of the projected portion to provide stiffness and the contact points provide flexibility during use.
Public/Granted literature
- US20080209721A1 MULTIPOINT NANOPROBE AND METHOD FOR FABRICATION Public/Granted day:2008-09-04
Information query
