Invention Grant
- Patent Title: Debris prevention system, radiation system, and lithographic apparatus
- Patent Title (中): 防碎片系统,辐射系统和光刻设备
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Application No.: US11826525Application Date: 2007-07-16
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Publication No.: US07687788B2Publication Date: 2010-03-30
- Inventor: Maarten Marinus Johannes Wilhelmus Van Herpen , Wouter Anthon Soer , Kurt Gielissen
- Applicant: Maarten Marinus Johannes Wilhelmus Van Herpen , Wouter Anthon Soer , Kurt Gielissen
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: H05G2/00
- IPC: H05G2/00

Abstract:
A debris prevention system is constructed and arranged to prevent debris that emanates from a radiation source from propagating with radiation from the radiation source into or within a lithographic apparatus. The debris prevention system includes an aperture that defines a maximum emission angle of the radiation coming from the radiation source, and a first debris barrier having a radiation transmittance. The first debris barrier includes a rotatable foil trap. The debris prevention system also includes a second debris barrier that has a radiation transmittance. The first debris barrier is configured to cover a part of the emission angle and the second debris barrier is configured to cover another part of the emission angle.
Public/Granted literature
- US20090021705A1 Debris prevention system, radiation system, and lithographic apparatus Public/Granted day:2009-01-22
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