Invention Grant
US07687824B2 Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device
有权
提高III族氮化物晶体的表面平坦度的方法,用于外延生长的衬底和半导体器件
- Patent Title: Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device
- Patent Title (中): 提高III族氮化物晶体的表面平坦度的方法,用于外延生长的衬底和半导体器件
-
Application No.: US11167078Application Date: 2005-06-24
-
Publication No.: US07687824B2Publication Date: 2010-03-30
- Inventor: Tomohiko Shibata , Keiichiro Asai , Shigeaki Sumiya
- Applicant: Tomohiko Shibata , Keiichiro Asai , Shigeaki Sumiya
- Applicant Address: JP Nagoya-Shi
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya-Shi
- Agency: Burr & Brown
- Priority: JP2004-192134 20040629; JP2004-329443 20041112; JP2005-132721 20050428; JP2005-168463 20050608
- Main IPC: H01L29/24
- IPC: H01L29/24

Abstract:
A heating process is performed in a nitrogen atmosphere at a temperature of not less than 1650° C. upon an epitaxial substrate including a single crystal base and an upper layer made of a group-III nitride crystal and epitaxially formed on a main surface of the single crystal base. The result shows that the heating process reduces the number of pits in a top surface to produce the effect of improving the surface flatness of the group-III nitride crystal. The result also shows that the dislocation density in the group-III nitride crystal is reduced to not more than one-half the dislocation density obtained before the heat treatment.
Public/Granted literature
Information query
IPC分类: