Invention Grant
US07687824B2 Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device 有权
提高III族氮化物晶体的表面平坦度的方法,用于外延生长的衬底和半导体器件

Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device
Abstract:
A heating process is performed in a nitrogen atmosphere at a temperature of not less than 1650° C. upon an epitaxial substrate including a single crystal base and an upper layer made of a group-III nitride crystal and epitaxially formed on a main surface of the single crystal base. The result shows that the heating process reduces the number of pits in a top surface to produce the effect of improving the surface flatness of the group-III nitride crystal. The result also shows that the dislocation density in the group-III nitride crystal is reduced to not more than one-half the dislocation density obtained before the heat treatment.
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