Invention Grant
US07688058B2 Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
有权
用于提供片上诊断功能的集成频谱分析仪电路和方法
- Patent Title: Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
- Patent Title (中): 用于提供片上诊断功能的集成频谱分析仪电路和方法
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Application No.: US12212247Application Date: 2008-09-17
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Publication No.: US07688058B2Publication Date: 2010-03-30
- Inventor: Keith Aelwyn Jenkins , Anup Paul Jose , Scott Kevin Reynolds
- Applicant: Keith Aelwyn Jenkins , Anup Paul Jose , Scott Kevin Reynolds
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: F. Chau & Associates, LLC
- Main IPC: G01R23/00
- IPC: G01R23/00 ; G01R23/14

Abstract:
Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which comprises a zero IF or near-zero IF framework, enables a low-power compact design with sufficient resolution bandwidth for on-chip implementation and diagnostics of internal chip signals.
Public/Granted literature
- US20090015238A1 Integrated Spectrum Analyzer Circuits and Methods for Providing On-Chip Diagnostics Public/Granted day:2009-01-15
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