Invention Grant
- Patent Title: Test apparatus
- Patent Title (中): 测试仪器
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Application No.: US11979511Application Date: 2007-11-05
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Publication No.: US07688087B2Publication Date: 2010-03-30
- Inventor: Chen-Chien Chih , Chun-Chen Liao
- Applicant: Chen-Chien Chih , Chun-Chen Liao
- Applicant Address: TW Hsin-Chu
- Assignee: King Yuan Electronics Co., Ltd.
- Current Assignee: King Yuan Electronics Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Sinorica, LLC
- Agent Ming Chow
- Priority: TW96117692A 20070518
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R1/06
Abstract:
An under testing device interface with mixed-signal processing circuit is disclosed. The under testing device interface with mixed signal processing circuit software of integrates the mixed-signal processing circuit into the probe card or device under testing card, the mixed-signal processing circuit with the pin electric channel of the tester, and the programs for handling the process of mixed-signal processing circuit into the system software of the tester.
Public/Granted literature
- US20080284454A1 Test interface with a mixed signal processing device Public/Granted day:2008-11-20
Information query
