Invention Grant
- Patent Title: Apparatus and method for analog-to-digital converter calibration
- Patent Title (中): 用于模数转换器校准的装置和方法
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Application No.: US12000757Application Date: 2007-12-17
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Publication No.: US07688237B2Publication Date: 2010-03-30
- Inventor: Jun Cao , Afshin Momtaz
- Applicant: Jun Cao , Afshin Momtaz
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Sterne, Kessler, Goldstein & Fox, PLLC.
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
Methods, systems, and apparatuses for calibration of analog to digital converters (ADC) are described herein. In an aspect, an ADC includes a plurality of slices. Each slice includes a digital to analog converter (DAC), a comparator, and a digital processing unit (DPU). The digital processing unit is electrically connected to the comparator and the DAC. In another aspect, an analog-to-digital converter includes an input module and an analog to digital converter core configured to receive an analog input from the input module and generate a digital output. The ADC is configured to adjust a precision of the analog to digital converter core based on a quality of the analog input signal.
Public/Granted literature
- US20080150772A1 Apparatus and method for analog-to-digital converter calibration Public/Granted day:2008-06-26
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