Invention Grant
US07688657B2 Apparatus and method for generating test signals after a test mode is completed
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测试模式完成后产生测试信号的装置和方法
- Patent Title: Apparatus and method for generating test signals after a test mode is completed
- Patent Title (中): 测试模式完成后产生测试信号的装置和方法
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Application No.: US11819421Application Date: 2007-06-27
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Publication No.: US07688657B2Publication Date: 2010-03-30
- Inventor: Sung-Joo Ha
- Applicant: Sung-Joo Ha
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Venable LLP
- Agent Jeffri A. Kaminski
- Priority: KR10-2006-0066695 20060718
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00
Abstract:
A test signal generating apparatus for a semiconductor integrated circuit includes a fuse control unit that generates a plurality of fuse enable signals in response to a clock and a power-up signal, and a plurality of test mode fuses that individually output test mode fuse signals so as to generate test signals in response to the fuse enable signals after a test mode is completed.
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