Invention Grant
US07688744B2 Broadband test line access circuit, broadband test-line access board and broadband test device
失效
宽带测试线接入电路，宽带测试线接入板和宽带测试设备
- Patent Title: Broadband test line access circuit, broadband test-line access board and broadband test device
- Patent Title (中): 宽带测试线接入电路，宽带测试线接入板和宽带测试设备
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Application No.: US11570998Application Date: 2005-07-20
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Publication No.: US07688744B2Publication Date: 2010-03-30
- Inventor: Tao Yang , Jun Zhou , Zhiguo Yan , Ruijie Xiao
- Applicant: Tao Yang , Jun Zhou , Zhiguo Yan , Ruijie Xiao
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Priority: CN200410054821 20040722
- International Application: PCT/CN2005/001078 WO 20050720
- International Announcement: WO2006/007790 WO 20060126
- Main IPC: G01R31/08
- IPC: G01R31/08
Abstract:
A broadband test line-access board includes at least two broadband test line-access units. Each of the at least two broadband test line-access units includes first, second, and third test terminals, a signal splitter, first, second, and third switches, and first second and third interface terminals. The broadband test line-access board further includes a set of inner test buses, including an internal inner-test bus, an internal outer-test bus and an internal auxiliary-test bus, and fourth, fifth, and sixth switches, and a low-pass filter.
Public/Granted literature
- US20080298262A1 Broadband Test Line Access Circuit, Broadband Test-Line Access Board And Broadband Test Device Public/Granted day:2008-12-04
Information query
