Invention Grant
- Patent Title: Vision test pattern indicator
- Patent Title (中): 视力测试模式指标
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Application No.: US12225156Application Date: 2007-04-23
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Publication No.: US07690790B2Publication Date: 2010-04-06
- Inventor: Yoshinobu Hosoi , Yuichiro Kanazawa
- Applicant: Yoshinobu Hosoi , Yuichiro Kanazawa
- Applicant Address: JP Gamagori
- Assignee: Nidek Co., Ltd.
- Current Assignee: Nidek Co., Ltd.
- Current Assignee Address: JP Gamagori
- Agency: Oliff & Berridge PLC
- Priority: JP2006-126528 20060428
- International Application: PCT/JP2007/058725 WO 20070423
- International Announcement: WO2007/125858 WO 20071108
- Main IPC: A61B3/02
- IPC: A61B3/02

Abstract:
A vision test pattern indicator is provided with a color display for displaying optotypes used for binocular vision tests which are conducted with a red filter set in front of an eye of an examinee and a green filter set in front of the other eye, and an arithmetic control part which controls the color display as a first optotype figure is displayed in a green color, a second optotype figure is displayed in a red color, a third optotype figure for fusion stimulus is displayed in a color excluding red and green components and a background of the optotypes is displayed in a white color.
Public/Granted literature
- US20090213327A1 Vision Test Pattern Indicator Public/Granted day:2009-08-27
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