Invention Grant
- Patent Title: Mounting structure for measuring device and grinding machine with the structure
- Patent Title (中): 具有结构的测量装置和磨床的安装结构
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Application No.: US11562194Application Date: 2006-11-21
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Publication No.: US07690967B2Publication Date: 2010-04-06
- Inventor: Akira Makiuchi
- Applicant: Akira Makiuchi
- Applicant Address: JP Osaka-shi
- Assignee: JTEKT Corporation
- Current Assignee: JTEKT Corporation
- Current Assignee Address: JP Osaka-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-354965 20051208
- Main IPC: B24B49/00
- IPC: B24B49/00

Abstract:
In a grinding machine, a bed 10 has secured thereon a work head 11 which rotatably supports a work spindle 12 for supporting a workpiece W and mounts thereon a slide base 15 reciprocatively movable in a Z-direction parallel to the axis of the work spindle, and a wheel head 16 carrying a rotating grinding wheel 17 is reciprocatively movable on the slide base in an X-direction intersecting with the Z-direction. A measuring device 25 for measuring the dimension of the workpiece ground with the grinding wheel is mounted on an extreme end of a support arm 21 secured to the slide base to extend in the X-direction, through an actuator device 23 which is operable for moving the measuring device between a measuring position for engagement with the workpiece and a parked position for disengagement therefrom. The support arm passes over the workpiece, or passes through a space between the bed and the workpiece, or passes through the inside of the bed.
Public/Granted literature
- US20070135021A1 MOUNTING STRUCTURE FOR MEASURING DEVICE AND GRINDING MACHINE WITH THE STRUCTURE Public/Granted day:2007-06-14
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