Invention Grant
- Patent Title: Sensor, measuring device, and measuring method
- Patent Title (中): 传感器,测量装置和测量方法
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Application No.: US11579638Application Date: 2005-04-22
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Publication No.: US07691255B2Publication Date: 2010-04-06
- Inventor: Fumihisa Kitawaki , Akihito Kamei , Tatsurou Kawamura
- Applicant: Fumihisa Kitawaki , Akihito Kamei , Tatsurou Kawamura
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2004-137075 20040506
- International Application: PCT/JP2005/007727 WO 20050422
- International Announcement: WO2005/188960 WO 20051117
- Main IPC: G01N27/327
- IPC: G01N27/327 ; G01N27/333 ; G01N21/00

Abstract:
A sensor capable of measuring a plurality of measuring items quickly and accurately, a measuring device, and a measuring method are provided. The sensor includes a sample-holding unit for holding a sample containing an analyte; a sample-supplying port for supplying the sample to the sample-holding unit; a detecting unit for carrying out an electrochemical measurement, the unit being provided in the sample-holding unit; an optical measuring unit for carrying out an optical measurement, the unit being provided in the sample-holding unit; and a reagent-holding unit for holding a reagent for the optical measurement, the unit being provided in the sample-holding unit; wherein in the flowing direction of the sample supplied from the sample-supplying port in sample-holding unit, the sample-supplying port, the detecting unit, and the reagent-holding unit are positioned in the order recited.
Public/Granted literature
- US20080105566A1 Sensor, Measuring Device, And Measuring Method Public/Granted day:2008-05-08
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