Invention Grant
- Patent Title: Chip using method and test chip
- Patent Title (中): 芯片使用方法和测试芯片
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Application No.: US10595262Application Date: 2004-10-04
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Publication No.: US07691328B2Publication Date: 2010-04-06
- Inventor: Yasuhiro Horiike , Akinori Yokogawa
- Applicant: Yasuhiro Horiike , Akinori Yokogawa
- Applicant Address: JP Ibaraki JP Kyoto
- Assignee: National Institute for Materials Science,Rohm Co., Ltd.
- Current Assignee: National Institute for Materials Science,Rohm Co., Ltd.
- Current Assignee Address: JP Ibaraki JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2003-346439 20031003
- International Application: PCT/JP2004/014988 WO 20041004
- International Announcement: WO2005/033666 WO 20050414
- Main IPC: G01N9/30
- IPC: G01N9/30 ; B01L3/00 ; B01L3/02 ; B01L11/00

Abstract:
An object of the invention is to provide a test chip which allows efficient and convenient separation and measurement. This invention provides a measuring chip for separating and measuring a target component in a sample by rotation around first and second axes of rotation. The measuring chip includes a centrifugal separation tube that centrifugally separates the target component from the sample by rotating the measuring chip around the first axis of rotation; a first holding section installed in the bottom of the centrifugal separation tube, wherein non-target components other than the target component in the sample are introduced therein by rotation around the first axis of rotation, and the first holding section holds the non-target components during rotation around the second axis of rotation; and a measuring section connected to one end of the centrifugal separation tube that measures the non-target components introduced from the centrifugal separation tube by rotation around the second axis of rotation.
Public/Granted literature
- US20070003433A1 Chip using method and test chip Public/Granted day:2007-01-04
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