Invention Grant
US07691558B2 Photosensitive composition, compound for use in the photosensitive composition and pattern forming method using the photosensitive composition 有权
感光组合物,用于感光组合物的化合物和使用感光组合物的图案形成方法

  • Patent Title: Photosensitive composition, compound for use in the photosensitive composition and pattern forming method using the photosensitive composition
  • Patent Title (中): 感光组合物,用于感光组合物的化合物和使用感光组合物的图案形成方法
  • Application No.: US11335679
    Application Date: 2006-01-20
  • Publication No.: US07691558B2
    Publication Date: 2010-04-06
  • Inventor: Kenji Wada
  • Applicant: Kenji Wada
  • Applicant Address: JP Tokyo
  • Assignee: FUJIFILM Corporation
  • Current Assignee: FUJIFILM Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JPP.2005-015965 20050124
  • Main IPC: G03F7/00
  • IPC: G03F7/00 G03F7/004
Photosensitive composition, compound for use in the photosensitive composition and pattern forming method using the photosensitive composition
Abstract:
A photosensitive composition for use in the production process of a semiconductor such as IC, in the production of a circuit substrate of liquid crystal, thermal head and the like or in other photofabrication processes, a compound for use in the photosensitive composition, and a pattern forming method using the photosensitive composition, are provided, which are a photosensitive composition excellent in the sensitivity, resolution and pattern profile, assured of large exposure latitude and small pitch dependency, and improved in the sensitivity and dissolution contrast at the exposure with EUV light, a pattern forming method using the photosensitive composition, and a compound useful for the photosensitive composition.
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