Invention Grant
- Patent Title: Reflected light detecting apparatus, reflection characteristic determining apparatus, and object detecting apparatus
- Patent Title (中): 反射光检测装置,反射特性判定装置以及物体检测装置
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Application No.: US12196512Application Date: 2008-08-22
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Publication No.: US07692137B2Publication Date: 2010-04-06
- Inventor: Takahiro Aoki , Soichi Hama , Mitsuaki Fukuda
- Applicant: Takahiro Aoki , Soichi Hama , Mitsuaki Fukuda
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Main IPC: H01J40/14
- IPC: H01J40/14

Abstract:
A photographing section photographs a photographing object, a light-projector projects a light spot parallel to or approximately parallel to an optical axis of the photographing section onto the photographing object, and a detector detects, from an image of the photographing object photographed by the photographing section, a light spot from the light-projector reflected by the photographing object on the basis of an arrangement position of the light-projector relative to the photographing section. A reflected light spot of light projected onto a detection object can be detected with certainty, and erroneous detection of the reflected light spot, in particular, erroneous detection due to disturbance light, can be prevented at a low cost, without an increase in size of the apparatus.
Public/Granted literature
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