Invention Grant
- Patent Title: Integrated scanning probe microscope and confocal microscope
- Patent Title (中): 集成扫描探针显微镜和共聚焦显微镜
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Application No.: US11975548Application Date: 2007-10-19
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Publication No.: US07692138B1Publication Date: 2010-04-06
- Inventor: David James Ray , Nicholas Gregory Doe , Terence Rogers Lundy
- Applicant: David James Ray , Nicholas Gregory Doe , Terence Rogers Lundy
- Agent Sandy Lipkin
- Main IPC: G01B5/28
- IPC: G01B5/28
Abstract:
A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.
Information query
