Invention Grant
- Patent Title: Device for analyzing an integrated circuit
- Patent Title (中): 用于分析集成电路的装置
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Application No.: US12088432Application Date: 2006-10-02
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Publication No.: US07692151B2Publication Date: 2010-04-06
- Inventor: Romain Desplats
- Applicant: Romain Desplats
- Applicant Address: FR Paris
- Assignee: Centre National d'Etudes Spatiales
- Current Assignee: Centre National d'Etudes Spatiales
- Current Assignee Address: FR Paris
- Agency: Young & Thompson
- Priority: FR0510038 20050930
- International Application: PCT/FR2006/002220 WO 20061002
- International Announcement: WO2007/036649 WO 20070405
- Main IPC: G01J5/02
- IPC: G01J5/02
Abstract:
A device (10) for analyzing a circuit (14) includes at least one element (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in the zone; elements (26) for exciting the circuit. The circuit exciting elements include a laser source (26) and elements (30) for applying a laser beam generated by the source on the observation zone (22). The device includes members (M1, M2) for protecting the observation zone (22) against the incident and reflected laser beams.
Public/Granted literature
- US20080218750A1 Device for Analyzing an Integrated Circuit Public/Granted day:2008-09-11
Information query
