Invention Grant
US07692275B2 Structure and method for device-specific fill for improved anneal uniformity
失效
用于器件特定填充的结构和方法,以改善退火均匀性
- Patent Title: Structure and method for device-specific fill for improved anneal uniformity
- Patent Title (中): 用于器件特定填充的结构和方法,以改善退火均匀性
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Application No.: US11678745Application Date: 2007-02-26
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Publication No.: US07692275B2Publication Date: 2010-04-06
- Inventor: Brent A. Anderson , Edward J. Nowak
- Applicant: Brent A. Anderson , Edward J. Nowak
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Gibb I.P. Law Firm, LLC
- Main IPC: H01L23/58
- IPC: H01L23/58

Abstract:
Disclosed are embodiments of a wafer that incorporates fill structures with varying configurations to provide uniform reflectance. Uniform reflectance is achieved by distributing across the wafer fill structures having different semiconductor materials such that approximately the same ratio and density between the different semiconductor materials is achieved within each region and, optimally, each sub-region. Alternatively, it is achieved by distributing across the wafer fill structures, including one or more hybrid fill structure containing varying proportions of different semiconductor materials, such that approximately the same ratio between the different semiconductor materials is achieved within each region and, optimally, each sub-region. Alternatively, it is achieved by distributing across the wafer fill structures having semiconductor materials with different thicknesses such that approximately the same overall ratio between the semiconductor material with the different thicknesses is achieved within each region and, optimally, each sub-region.
Public/Granted literature
- US20080203540A1 STRUCTURE AND METHOD FOR DEVICE-SPECIFIC FILL FOR IMPROVED ANNEAL UNIFORMITY Public/Granted day:2008-08-28
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