Invention Grant
US07692442B2 Apparatus for detecting a current and temperature for an integrated circuit 有权
用于检测集成电路的电流和温度的装置

Apparatus for detecting a current and temperature for an integrated circuit
Abstract:
The present invention discloses an apparatus for detecting a current flowing from a first node to a second node. One or more MOS devices are serially coupled between the first and second nodes. Each of the MOS devices has its body connected to its source and its gate connected to its drain for providing each MOS device with a voltage difference between its gate and its source that is lower than a threshold voltage of the same, such that a voltage difference measured between the first and second nodes responds to a change of the current exponentially.
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