Invention Grant
- Patent Title: Interference monitoring in an RFID system
- Patent Title (中): RFID系统中的干扰监测
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Application No.: US11194145Application Date: 2005-07-29
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Publication No.: US07692532B2Publication Date: 2010-04-06
- Inventor: Jeffrey H. Fischer , David J. Husak , Pattabhiraman Krishna
- Applicant: Jeffrey H. Fischer , David J. Husak , Pattabhiraman Krishna
- Applicant Address: US MA Chelmsford
- Assignee: Reva Systems Corporation
- Current Assignee: Reva Systems Corporation
- Current Assignee Address: US MA Chelmsford
- Agency: Weingarten, Schurgin, Gagnebin & Lebovici LLP
- Main IPC: H04Q5/22
- IPC: H04Q5/22 ; G08B13/14 ; G08C19/00

Abstract:
A system and method for monitoring and characterizing various sources of RF interference within an RFID environment, and for adjusting the operational characteristics of an array of RFID readers within the system based on these interference characterizations. The system examines the received transmissions from readers in the network by controlling a calibration cycle or while they are operating as interrogators to determine interference parameters, and to verify the operation of the readers in the array. The system also examines outside sources of interference, and signal dependent interference. The interference characterization can also be estimated from a combination of calculations and co-monitoring.
Public/Granted literature
- US20060022815A1 Interference monitoring in an RFID system Public/Granted day:2006-02-02
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