Invention Grant
US07692764B2 Exposure apparatus, operation decision method, substrate processing system, maintenance management method, and device manufacturing method 有权
曝光装置,操作决定方法,基板处理系统,维护管理方法和装置制造方法

  • Patent Title: Exposure apparatus, operation decision method, substrate processing system, maintenance management method, and device manufacturing method
  • Patent Title (中): 曝光装置,操作决定方法,基板处理系统,维护管理方法和装置制造方法
  • Application No.: US11660906
    Application Date: 2005-08-29
  • Publication No.: US07692764B2
    Publication Date: 2010-04-06
  • Inventor: Yousuke Shirata
  • Applicant: Yousuke Shirata
  • Applicant Address: JP Tokyo
  • Assignee: Nikon Corporation
  • Current Assignee: Nikon Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Staas & Halsey LLP
  • Priority: JP2004-249395 20040830
  • International Application: PCT/JP2005/015628 WO 20050829
  • International Announcement: WO2006/025302 WO 20060309
  • Main IPC: G03B27/42
  • IPC: G03B27/42 G03B27/32 G03D5/00 G06F19/00
Exposure apparatus, operation decision method, substrate processing system, maintenance management method, and device manufacturing method
Abstract:
An exposure apparatus is equipped with a main controller that decides an operation of the exposure apparatus based on information on maintenance from a C/D. Therefore, the main controller can decide to perform a specific operation, which is necessary for maintaining performance of the exposure apparatus and requires stop of the primary operation of the exposure apparatus, during maintenance of the C/D, that is, when the primary operation of the exposure apparatus has to be stopped by necessity, in parallel with the maintenance of the C/D. As a consequence, downtime of the exposure apparatus necessary for performing the specific operation can be decreased as a whole, which makes it possible to improve the operating rate without lowering apparatus performance of the exposure apparatus that is inline connected to a substrate processing apparatus.
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