Invention Grant
- Patent Title: Memory readout circuit and phase-change memory device
- Patent Title (中): 存储器读出电路和相变存储器件
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Application No.: US11943608Application Date: 2007-11-21
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Publication No.: US07692979B2Publication Date: 2010-04-06
- Inventor: Yukio Fuji , Yasuko Tonomura
- Applicant: Yukio Fuji , Yasuko Tonomura
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2006-314215 20061121
- Main IPC: G11C7/22
- IPC: G11C7/22

Abstract:
In a memory readout circuit for use in a phase-change memory device comprising phase-change elements as memory cells, a sense amplifier sets readout voltage, which is applied to a selected phase-change element selected among the phase-change elements by a column selecting switch, to voltage equal to or higher than hold voltage of the selected phase-change element but lower than transition voltage of the selected phase-change element in a readout cycle. The selected phase-change element is read out as a dynamic state in the case where the selected phase-change element is in a set state.
Public/Granted literature
- US20080117669A1 MEMORY READOUT CIRCUIT AND PHASE-CHANGE MEMORY DEVICE Public/Granted day:2008-05-22
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