Invention Grant
- Patent Title: Deterministic wavelet thresholding for general-error metrics
- Patent Title (中): 一般误差度量的确定性小波阈值
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Application No.: US11152842Application Date: 2005-06-13
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Publication No.: US07693335B2Publication Date: 2010-04-06
- Inventor: Minos N. Garofalakis , Amit Kumar
- Applicant: Minos N. Garofalakis , Amit Kumar
- Applicant Address: US NJ Murray Hill
- Assignee: Alcatel-Lucent USA Inc.
- Current Assignee: Alcatel-Lucent USA Inc.
- Current Assignee Address: US NJ Murray Hill
- Agency: Wall & Tong, LLP
- Main IPC: G06K9/46
- IPC: G06K9/46

Abstract:
Novel, computationally efficient schemes for deterministic wavelet thresholding with the objective of optimizing maximum-error metrics are provided. An optimal low polynomial-time algorithm for one-dimensional wavelet thresholding based on a new dynamic-programming (DP) formulation is provided that can be employed to minimize the maximum relative or absolute error in the data reconstruction. Directly extending a one-dimensional DP algorithm to multi-dimensional wavelets results in a super-exponential increase in time complexity with the data dimensionality. Thus, novel, polynomial-time approximation schemes (with tunable approximation guarantees for the target maximum-error metric) for deterministic wavelet thresholding in multiple dimensions are also provided.
Public/Granted literature
- US20060280378A1 Deterministic wavelet thresholding for general-error metrics Public/Granted day:2006-12-14
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