Invention Grant
US07693673B2 Apparatus and method for identifying a defect and/or operating characteristic of a system
有权
用于识别系统的缺陷和/或操作特性的装置和方法
- Patent Title: Apparatus and method for identifying a defect and/or operating characteristic of a system
- Patent Title (中): 用于识别系统的缺陷和/或操作特性的装置和方法
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Application No.: US11758996Application Date: 2007-06-06
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Publication No.: US07693673B2Publication Date: 2010-04-06
- Inventor: Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, Jr. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
- Applicant: Huageng Luo , Michael Richard Durling , Andrew Lawrence Ruggiero , Zongqi Sun , Harry Kirk Mathews, Jr. , Robert William Tait , Benjamin Paul Church , Thomas Anthony Tougas
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent John A. Kramer, Patent Counsel
- Main IPC: G01K15/00
- IPC: G01K15/00 ; B61K9/04

Abstract:
An apparatus and methods for identifying a defect and/or an operating characteristic of a system being monitored (and/or one or more of the system's components) are described. In an embodiment, orthogonally related data monitored by two or more detectors may be fused to determine whether a component of a system is defective and/or malfunctioning. Additionally or alternatively, data from a first detector may be determined to be accurate using non-orthogonally related data outputted by a second detector. Both types of determinations may be made with minimal or no false indications, which lowers the cost of operating the system being monitored. Embodiments of the invention may also be configured to forecast and/or prevent accidents and/or damage to the system being monitored by predicting whether a defect and/or a malfunction will occur.
Public/Granted literature
- US20080306705A1 APPARATUS AND METHOD FOR IDENTIFYING A DEFECT AND/OR OPERATING CHARACTERISTIC OF A SYSTEM Public/Granted day:2008-12-11
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