Invention Grant
US07694197B2 Integrated circuit comprising a test mode secured by detection of the state of a control signal 有权
集成电路包括通过检测控制信号的状态而保证的测试模式

Integrated circuit comprising a test mode secured by detection of the state of a control signal
Abstract:
An electronic circuit comprises configurable cells driven by command signals to adopt either a standard mode of operation in which they are integrated into a logic circuit, or a test mode in which they provide information on this logic circuit. The circuit includes a spy circuit capable of detecting an abnormal excitation of certain of the conductors through which the command signals travel, thus preventing fraudulent extraction of data out of the configurable cells. The spy circuit includes a logic combination circuit and a state detection cell.
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