Invention Grant
- Patent Title: Two-pass MRET trace selection for dynamic optimization
- Patent Title (中): 双向MRET跟踪选择用于动态优化
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Application No.: US11241527Application Date: 2005-09-30
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Publication No.: US07694281B2Publication Date: 2010-04-06
- Inventor: Cheng Wang , Bixia Zheng , Ho-seop Kim , Mauricio Breternitz, Jr. , Youfeng Wu
- Applicant: Cheng Wang , Bixia Zheng , Ho-seop Kim , Mauricio Breternitz, Jr. , Youfeng Wu
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F9/44
- IPC: G06F9/44
Abstract:
A first potential hot trace of a program is determined. A second potential hot trace of the program is determined. A common path from the first potential hot trace and the second potential hot trace is selected as the selected hot trace of the program.
Public/Granted literature
- US20070079293A1 Two-pass MRET trace selection for dynamic optimization Public/Granted day:2007-04-05
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