Invention Grant
US07695637B2 Slurry composition for chemical mechanical polishing and precursor composition thereof
有权
用于化学机械抛光的浆料组合物及其前体组合物
- Patent Title: Slurry composition for chemical mechanical polishing and precursor composition thereof
- Patent Title (中): 用于化学机械抛光的浆料组合物及其前体组合物
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Application No.: US11615094Application Date: 2006-12-22
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Publication No.: US07695637B2Publication Date: 2010-04-13
- Inventor: Tae Won Park , In Kyung Lee , Byoung Ho Choi
- Applicant: Tae Won Park , In Kyung Lee , Byoung Ho Choi
- Applicant Address: KR Gum-si
- Assignee: Cheil Industries Inc.
- Current Assignee: Cheil Industries Inc.
- Current Assignee Address: KR Gum-si
- Agency: Summa, Additon & Ashe, P.A.
- Priority: KR10-2006-0117367 20061127
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
Disclosed are a slurry composition for chemical mechanical polishing and a precursor composition thereof. The polishing slurry composition includes deionized water, abrasive particles, a pH-adjusting agent and a surfactant, wherein the surfactant includes two or more ionic moieties and two or more lipophilic groups. The polishing slurry composition can polish convex surfaces of a semiconductor having a step height at a higher rate than the polishing rate for concave surfaces acting as polishing stop layers of the semiconductor so that the polishing can be self-stopped, reduces the occurrence of surface defects after the polishing process, and has a high degree of polishing planarization and good dispersion stability.
Public/Granted literature
- US20080121839A1 Slurry Composition for Chemical Mechanical Polishing and Precursor Composition Thereof Public/Granted day:2008-05-29
Information query
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