Invention Grant
- Patent Title: Gene detection field-effect device and method of analyzing gene polymorphism therewith
- Patent Title (中): 基因检测场效应仪及其分析基因多态性的方法
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Application No.: US10587941Application Date: 2005-02-03
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Publication No.: US07695907B2Publication Date: 2010-04-13
- Inventor: Yuji Miyahara , Toshiya Sakata
- Applicant: Yuji Miyahara , Toshiya Sakata
- Applicant Address: JP Ibaraki
- Assignee: National Institute for Materials Science
- Current Assignee: National Institute for Materials Science
- Current Assignee Address: JP Ibaraki
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2004-026821 20040203
- International Application: PCT/JP2005/001987 WO 20050203
- International Announcement: WO2005/075638 WO 20050818
- Main IPC: C12Q1/68
- IPC: C12Q1/68

Abstract:
A gene detection field-effect device provided with an insulation film (2), a semiconductor substrate (3), and a reference electrode (4), includes: (a) the insulation film (2) including a nucleic acid probe (5) immobilized on one of the surfaces thereof and is in contact with a sample solution (6) containing at least one type of a target gene (601) for detection and analysis; (b) the semiconductor substrate (3) being installed so as to abut against the other surface of the insulation film (2); and (c) the reference electrode (4) being provided in the sample solution (6).
Public/Granted literature
- US20080286762A1 Gene Detection Field-Effect Device And Method Of Analyzing Gene Polymorphism Therewith Public/Granted day:2008-11-20
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