Invention Grant
US07696047B2 Method for evaluating a gate insulation film characteristic for use in a semiconductor device
失效
用于评估半导体器件中使用的栅极绝缘膜特性的方法
- Patent Title: Method for evaluating a gate insulation film characteristic for use in a semiconductor device
- Patent Title (中): 用于评估半导体器件中使用的栅极绝缘膜特性的方法
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Application No.: US12183704Application Date: 2008-07-31
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Publication No.: US07696047B2Publication Date: 2010-04-13
- Inventor: Masayasu Miyata , Masamitsu Uehara
- Applicant: Masayasu Miyata , Masamitsu Uehara
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2003-421655 20031218; JP2004-219192 20040727
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L21/336

Abstract:
A gate insulating film 3 is formed of an insulative inorganic material containing silicon and oxygen as a main material. The gate insulating film 3 contains hydrogen atoms. A part of the absorbance of infrared radiation of which wave number is in the range of 830 to 900 cm−1 is less than both the absorbance of infrared radiation at the wave number of 830 cm−1 and the absorbance of infrared radiation at the wave number of 900 cm−1 when the insulating film to which an electric field has never been applied is measured by means of Fourier Transform Infrared Spectroscopy at room temperature. Further, in the case where the absolute value of the difference between the absorbance of infrared radiation at the wave number of 830 cm−1 and the absorbance of infrared radiation at the wave number of 770 cm−1 is defined as A and the absolute value of the difference between the absorbance of infrared radiation at the wave number of 900 cm−1 and the absorbance of infrared radiation at the wave number of 990 cm−1 is defined as B, then A and B satisfy the relation: A/B is 1.8 or more.
Public/Granted literature
- US20080293170A1 METHOD FOR EVALUATING A GATE INSULATION FILM CHARACTERISTIC FOR USE IN A SEMICONDUCTOR DEVICE Public/Granted day:2008-11-27
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