Invention Grant
- Patent Title: Electromagnetic induction type inspection device and method
- Patent Title (中): 电磁感应式检测装置及方法
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Application No.: US11593560Application Date: 2006-11-07
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Publication No.: US07696747B2Publication Date: 2010-04-13
- Inventor: Hiroaki Kohama , Kazuhiko Yasohama , Makio Iwamoto , Takayuki Yamaki , Ichiro Fujitomi
- Applicant: Hiroaki Kohama , Kazuhiko Yasohama , Makio Iwamoto , Takayuki Yamaki , Ichiro Fujitomi
- Applicant Address: JP Kanagawa
- Assignee: Kaisei Engineer Co., Ltd.
- Current Assignee: Kaisei Engineer Co., Ltd.
- Current Assignee Address: JP Kanagawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2005-322454 20051107
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01R33/12

Abstract:
Any inspection object regardless of material can easily be inspected or discriminated with high accuracy and high sensitivity by being placed in a magnetic field generated by applying an alternating current to an exciting coil and detecting changes of voltage level and phase of electromotive force induced by a detection coil unit. The discrimination of the inspection object is performed on the basis of a DC voltage value with respect to a standard specimen and a phase differential voltage value with respect to a phase difference between the phase of a voltage signal from the induction coil and the phase of the exciting current to the exciting coil.
Public/Granted literature
- US20100052667A1 ELECTROMAGNETIC INDUCTION TYPE INSPECTION DEVICE AND METHOD Public/Granted day:2010-03-04
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