Invention Grant
- Patent Title: Method and apparatus for resistivity measurements using dual impedance voltage measurements
- Patent Title (中): 使用双阻抗电压测量的电阻率测量方法和装置
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Application No.: US11759700Application Date: 2007-06-07
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Publication No.: US07696757B2Publication Date: 2010-04-13
- Inventor: Gregory B. Itskovich , Alexandre N. Bespalov
- Applicant: Gregory B. Itskovich , Alexandre N. Bespalov
- Applicant Address: US TX Houston
- Assignee: Baker Hughes Incorporated
- Current Assignee: Baker Hughes Incorporated
- Current Assignee Address: US TX Houston
- Agency: Mossman Kumar & Tyler PC
- Main IPC: G01V3/20
- IPC: G01V3/20
Abstract:
Measurements made by a four terminal resistivity imaging tool in a borehole using a voltage measurement device with two different input impedances. From the two measurements, formation resistivity is determined with minimal sensitivity to standoff.
Public/Granted literature
- US20080303526A1 Imaging Based on 4-Terminal Dual-Resistor Voltage Measurements Public/Granted day:2008-12-11
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