Invention Grant
- Patent Title: Strain gauge for measuring large strains
- Patent Title (中): 用于测量大菌株的应变计
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Application No.: US11787840Application Date: 2007-04-17
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Publication No.: US07696855B2Publication Date: 2010-04-13
- Inventor: Takeshi Sugimoto , Hiroaki Furukawa , Yasuhiro Uchino
- Applicant: Takeshi Sugimoto , Hiroaki Furukawa , Yasuhiro Uchino
- Applicant Address: JP Tokyo
- Assignee: Kyowa Electronic Instruments Co., Ltd.
- Current Assignee: Kyowa Electronic Instruments Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Jordan and Hamburg LLP
- Priority: JP2006-115065 20060418
- Main IPC: G01L1/22
- IPC: G01L1/22

Abstract:
The strain gauge for measuring large strains has metallic foil pattern sections including a gauge element pattern section, gauge tab pattern sections and connecting pattern sections attached to a gauge base. The gauge base having the metallic foil pattern sections attached and connected with the bases of gauge leads is almost entirely covered on the surface with a laminating film, and the tip of the laminating film is extended by a predetermined length from the tip end of the gauge base, to form a protruding portion. The protruding portion functions to prevent the separation of the gauge base from an object to be measured.
Public/Granted literature
- US20070279180A1 Strain gauge for measuring large strains Public/Granted day:2007-12-06
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