Invention Grant
US07696936B2 Method of and device for determining at least one characteristic parameter of a resonant structure 失效
用于确定谐振结构的至少一个特性参数的方法和装置

  • Patent Title: Method of and device for determining at least one characteristic parameter of a resonant structure
  • Patent Title (中): 用于确定谐振结构的至少一个特性参数的方法和装置
  • Application No.: US10591552
    Application Date: 2005-03-02
  • Publication No.: US07696936B2
    Publication Date: 2010-04-13
  • Inventor: Achim Hilgers
  • Applicant: Achim Hilgers
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP04100889 20040305
  • International Application: PCT/IB2005/050761 WO 20050302
  • International Announcement: WO2005/086279 WO 20050915
  • Main IPC: G01R29/10
  • IPC: G01R29/10
Method of and device for determining at least one characteristic parameter of a resonant structure
Abstract:
A method of determining at least one characteristic parameter of a resonant structure (4) comprising the following steps: firstly placing the resonant structure (4) at a location, said location being located in the far field of a first antenna (2) and in the far field of a second antenna (5), and secondly emitting electromagnetic waves (EEW) with different frequencies in a given frequency range by means of the first antenna (2) such that the emitted electromagnetic waves (EEW) are modified by the resonant structure (4) and modified electromagnetic waves (MEW) are achieved, and thirdly determining during a first determining step a first electric power-value being representative of the power associated with the emitted electromagnetic waves (EEW), and fourthly receiving the generated modified electromagnetic waves (MEW) by means of the second antenna (5) and fifthly determining during a second determining step a second electric power-value being representative of the power associated with the received modified electromagnetic waves (MEW), and sixthly determining the at least one characteristic parameter by using the first and second power-values determined during the first and second determining steps.
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