Invention Grant
- Patent Title: Method and apparatus for analyzing twinned crystal
- Patent Title (中): 用于分析双晶体的方法和装置
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Application No.: US11471947Application Date: 2006-06-21
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Publication No.: US07696991B2Publication Date: 2010-04-13
- Inventor: Tsuneyuki Higashi
- Applicant: Tsuneyuki Higashi
- Applicant Address: JP Akishima-Shi
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Akishima-Shi
- Agency: Frishauf, Holtz, Goodman & Chick, P.C.
- Priority: JP2005-184891 20050624
- Main IPC: G06T15/00
- IPC: G06T15/00

Abstract:
A method and an apparatus for analyzing a twinned crystal can display three-dimensionally the real space unit lattice, the reciprocal space primitive lattices and the reciprocal lattice points of each component of the twinned crystal. Respective crystal orientation matrices of the plural components of the twinned crystal are obtained with the use of X-ray single crystal structure analytical equipment. The first computing means finds the real-space unit lattices of the plural components based on the crystal orientation matrices and creates display data for displaying them three-dimensionally with possible their rotation, scaling up and down and translation. The second computing means finds the reciprocal-space primitive lattices and creates display data for displaying them three-dimensionally. The third computing means creates display data for displaying three-dimensionally reciprocal lattice points causing X-ray diffraction with a distinction between the components of the twinned crystal.
Public/Granted literature
- US20070005268A1 Method and apparatus for analyzing twinned crystal Public/Granted day:2007-01-04
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |