Invention Grant
- Patent Title: Laser scanning microscope apparatus
- Patent Title (中): 激光扫描显微镜装置
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Application No.: US11294689Application Date: 2005-12-05
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Publication No.: US07696996B2Publication Date: 2010-04-13
- Inventor: Toshiyuki Hattori , Mitsuhiro Nakano , Yusuke Yamashita , Hiroshi Hirayama , Tatsuo Nakata
- Applicant: Toshiyuki Hattori , Mitsuhiro Nakano , Yusuke Yamashita , Hiroshi Hirayama , Tatsuo Nakata
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Frishauf, Holtz, Goodman & Chick, P.C.
- Priority: JP2004-360604 20041213; JP2005-161447 20050601; JP2005-162433 20050602
- Main IPC: G06T11/20
- IPC: G06T11/20

Abstract:
A laser scanning microscope capable of quickly and accurately setting control values of control items for a microscope apparatus is provided. The control items and a time line are displayed along a vertical axis and a horizontal axis, respectively. The laser scanning microscope includes a graphical user interface configured to set the control values of the control items along the time line and a control unit configured to acquire luminance information of a specimen by irradiating the specimen with a laser beam in accordance with the control values set by the graphical user interface.
Public/Granted literature
- US20060129353A1 Laser scanning microscope apparatus Public/Granted day:2006-06-15
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