Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US10585873Application Date: 2005-01-14
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Publication No.: US07697110B2Publication Date: 2010-04-13
- Inventor: Hiroyuki Nagasaka , Taro Yamamoto , Osamu Hirakawa
- Applicant: Hiroyuki Nagasaka , Taro Yamamoto , Osamu Hirakawa
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Nikon Corporation,Tokyo Electron Limited
- Current Assignee: Nikon Corporation,Tokyo Electron Limited
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-017161 20040126
- International Application: PCT/JP2005/000350 WO 20050114
- International Announcement: WO2005/071717 WO 20050804
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42

Abstract:
An exposure apparatus for emitting exposure light onto a substrate via a projection optical system and a liquid to expose the substrate includes a supply pipe which supplies the liquid; a recovery pipe which recovers the liquid; a connection pipe which connects the supply pipe and the recovery pipe; and a switching device which switches a flow path of the liquid so that when liquid supply is stopped, the liquid that has flowed into the supply pipe flows to the recovery pipe via the connection pipe. The apparatus may further include a temperature regulation apparatus connected to the supply pipe, which performs temperature regulation of the liquid supplied to the supply pipe, and has a rough temperature regulator which roughly regulates the temperature of the liquid, and a fine temperature regulator which is arranged between the rough temperature regulator and the supply pipe and performs fine regulation of this temperature.
Public/Granted literature
- US20070242241A1 Exposure Apparatus and Device Manufacturing Method Public/Granted day:2007-10-18
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