Invention Grant
- Patent Title: Automated display quality measurement device
- Patent Title (中): 自动显示质量测量装置
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Application No.: US12104290Application Date: 2008-04-16
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Publication No.: US07697131B2Publication Date: 2010-04-13
- Inventor: Kenneth D. Konopa , Paul Heydron
- Applicant: Kenneth D. Konopa , Paul Heydron
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Dorsey & Whitney LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display device. In another embodiment, the method comprises an automated method of comparing the measured data from the light meter with an ideal image. In another embodiment, the method comprises obtaining a digital image of the test pattern displayed on the display device, and the digital image is compared with an ideal image.
Public/Granted literature
- US20090262341A1 AUTOMATED DISPLAY QUALITY MEASUREMENT DEVICE Public/Granted day:2009-10-22
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