Invention Grant
US07697249B2 Voltage clamping circuits using MOS transistors and semiconductor chips having the same and methods of clamping voltages
有权
使用具有相同的MOS晶体管和半导体芯片的钳位电路以及钳位电压的方法
- Patent Title: Voltage clamping circuits using MOS transistors and semiconductor chips having the same and methods of clamping voltages
- Patent Title (中): 使用具有相同的MOS晶体管和半导体芯片的钳位电路以及钳位电压的方法
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Application No.: US11646535Application Date: 2006-12-28
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Publication No.: US07697249B2Publication Date: 2010-04-13
- Inventor: Kyoung-Sik Im , Han-Gu Kim , Jae-Hyok Ko , Il-Hun Son , Suk-Jin Kim
- Applicant: Kyoung-Sik Im , Han-Gu Kim , Jae-Hyok Ko , Il-Hun Son , Suk-Jin Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2006-0001668 20060106
- Main IPC: H02H3/22
- IPC: H02H3/22

Abstract:
A clamping circuit is provided, which may clamp a voltage at a node of a circuit to a stable level by using a transistor already included in the circuit. The clamping circuit may clamp a voltage at a first node of a circuit inside a semiconductor chip to a more stable level when electro-static discharge (ESD) occurs. The clamping circuit may include a transistor and a capacitive element to store a control voltage to turn on the transistor in response to ESD.
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