Invention Grant
- Patent Title: Operating condition monitoring apparatus, method for monitoring operating condition and program
- Patent Title (中): 运行条件监控装置,运行状态监控方法
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Application No.: US11923173Application Date: 2007-10-24
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Publication No.: US07698011B2Publication Date: 2010-04-13
- Inventor: Manabu Tsuda , Toru Fujii
- Applicant: Manabu Tsuda , Toru Fujii
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JP2006-293075 20061027
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
An operating condition monitoring apparatus includes a load-time information acquisition unit 203 obtaining load-time information, of one or more production apparatuses 11, concerning load time allocated to production within a predetermined period, an operating-time information acquisition unit 204 obtaining operating-time information, of one or more production apparatuses 11, concerning operating time that is operable time for the production apparatuses within the predetermined period, an individual operating-rate calculation unit 205 calculating an individual operating rate of one or more production apparatuses 11 by dividing the operating time indicated in the operating-time information by the load time indicated in the load-time information, and an output unit 213 outputting the individual operating rate, in order to identify the production apparatus causing the stoppage of a production line.
Public/Granted literature
- US20080103715A1 OPERATING CONDITION MONITORING APPARATUS, METHOD FOR MONITORING OPERATING CONDITION AND PROGRAM Public/Granted day:2008-05-01
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