Invention Grant
- Patent Title: Techniques for detecting open integrated circuit pins
- Patent Title (中): 检测开路集成电路引脚的技术
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Application No.: US11828023Application Date: 2007-07-25
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Publication No.: US07698610B2Publication Date: 2010-04-13
- Inventor: Angel Maria Gomez Arguello
- Applicant: Angel Maria Gomez Arguello
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Dillon & Yudell LLP
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A technique of detecting an open integrated circuit (IC) pin includes selectively coupling a first open detect circuit, which includes a first inverter having a first threshold, to the IC pin. Next, a first logic state at an output of the first inverter is determined. Then, based upon the first logic state, it is determined whether the IC pin is open or whether it is indeterminate as to whether the IC pin is open. When it is indeterminate as to whether the IC pin is open, based on the first logic state, a second open detect circuit is selectively coupled to the IC pin. The second open detect circuit includes a second inverter having a second threshold (the first threshold is greater than the second threshold). A second logic state at an output of the second inverter is then determined. Finally, based upon the first and second logic states, it is determined whether the IC pin is open.
Public/Granted literature
- US20090027059A1 Techniques for Detecting Open Integrated Circuit Pins Public/Granted day:2009-01-29
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