Invention Grant
US07699471B2 Subjective refraction method and device for correcting low and higher order aberrations 有权
用于校正低阶和高阶像差的主观折射法和装置

  • Patent Title: Subjective refraction method and device for correcting low and higher order aberrations
  • Patent Title (中): 用于校正低阶和高阶像差的主观折射法和装置
  • Application No.: US11675079
    Application Date: 2007-02-14
  • Publication No.: US07699471B2
    Publication Date: 2010-04-20
  • Inventor: Shui T. Lai
  • Applicant: Shui T. Lai
  • Agency: SF Bay Area Patents, LLC
  • Agent Andrew V. Smith
  • Main IPC: A61B3/02
  • IPC: A61B3/02 A61B3/00
Subjective refraction method and device for correcting low and higher order aberrations
Abstract:
A subjective refraction technique uses a plane wave light source including substantially a point as a viewing target. The refraction method provide for a number of distinct identifiable end points. By finding such end points the process leads to an aberration-corrected vision. A defocus corrector assembly (DCA) includes a lens that is moveable along an optical axis between a patient's eye and the point light source for adjusting defocus power until the patient indicates that the blurry image has become a relatively focused line image. An astigmatism corrector assembly (ACA) which is capable of continuously variable in its amplitude is provided including a pair of astigmatism plates for adjusting astigmatism power and axis angle. The ACA is adjusted until the patient indicates that the line image has become a substantially round image. A reference marker provides displayed items including a sweep line overlapping at the point source and having an orientation which is adjustable. The patient may subjectively control the sweep angle of the sweep line and indicate that the sweep line is aligned with the sharp line image of the point source, thereby providing axis angle data of astigmatism errors of the patient's eye.
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